This video introduces you to data analysis using the completeEASE software for our J.A. Woolam M-2000 spectroscopic ellipsometer. In this you will see an example of modeling Aluminum Oxide sputtered on Silicon using a Cauchy function. Note that this is not a substitute for a course in ellipsometry. These examples are basic and do not cover fundamentals of how ellipsometry works. ___ Disclaimer: This video is intended to serve as supplemental information and cannot replace in-person instrument training. Caltech and KNI are not responsible for how the presented information is translated for use in other facilities. For information or questions about this video, contact kni@caltech.edu